After the catalyst synthesis and decoration of the support materials (carbon species in this case decorated with Pt nano-particles, by any method), one needs to know “how much” Pt is there to take it into account for normalizing the electrochemical results by the mass of Pt catalyst. One reliable and mostly used method is the TGA to determine the Pt fraction of the “support-catalyst” system, right after the synthesis of the material (washing & drying of course considered).

However, this is not exactly when this “support-catalyst” system is electrochemically characterized, but there are also intermediate steps such as preparation of the slurry or paste for casting on the glassy carbon electrode which involves a lot of sonication. Since this sonication could give rise to some of Pt nano-particles come off the support, the final loading could be less than what measured by the primary TGA.

Another necessary step to characterize the behavior of the “support-catalyst” system is the surface chemistry that is assessed by the XPS. Usually the prepared slurry can be drop-cast on a XPS neutral substrate (e.g., Si wafer) and analyzed. This XPS can also give a quantitative measurement of the materials and their oxidation states. But since it is done after the sonication, the probably disintegrated Pt particles can be assumed to be put out of the total sum (to avoid any destructive interference in the final XPS results, nafion can be added to the slurry after the sample collection for XPS).

So, the question is if one can rely on this XPS result for Pt loading instead of TGA.

Similar questions and discussions