Help, I want to measure the reciprocal space mapping of a thin film deposited on STO (111) substrate. I want to measure RSM around two planes (312) and (222). What should be the azimuth plane in both cases?
If you want map 222 you don't need to move your sample because it is already in "reflection" condition. If you want map 312 or any equivalent you need to move this plane into "reflection" condition. This might be a bit tricky. I do not know the capacities of Brukers D8, but I assume you can tilt your sample around two axis, e.g. rotate around the normal axis and tilt around a second axis like omega or even an axis perpendicular to omega and phi. The zenith angle is defined by:
cos rho =sqrt(1*3+1*1+1*2)/sqrt(1^2+1^2+1^2)/sqrt(3^2+1^2+2^2)
If you now rotate around the sample normal (phi) the 312 should appear 6 times. You should open your detector window first, in order to find the peaks.
If you know other crystal directions of your sample (e.g. by the substrate) you can even calculate it.