Quality (standard) pattern for XRD of: SiB6, SiB3, Si0.4B5.82, SiB6+x in text format.
Details needed 2θ and intensity.
Dear Ararti,
XRD instrument works such a way that angle of incident(theta) = angle of reflection to maintain a constant focusing distance by changing relative positions of incident x ray, sample surface and reflected x ray. So the angle between incident and reflected x ray will be 2 theta.For enriching your knowledge you can go through the following DOI/article.
(Article:Electronic Supplementary Material (ESI) for RSC Advances This journal is © The Royal Society of Chemistry 2012 )
Regards,
M.O.Aquatar
Hi, I found some papers that might help you.
for SiB6: https://www.researchgate.net/figure/Calculated-X-ray-diffraction-pattern-of-P2-1-m-SiB-6-compared-with-experimental-data_fig4_315002666
for SiB3: https://www.materials-talks.com/blog/2020/05/14/basics-to-powder-x-ray-diffraction-how-to-achieve-high-quality-xrd-patterns-qa/
https://nvlpubs.nist.gov/nistpubs/jres/46/jresv46n4p318_A1b.pdf
Dear Ararti,
XRD instrument works such a way that angle of incident(theta) = angle of reflection to maintain a constant focusing distance by changing relative positions of incident x ray, sample surface and reflected x ray. So the angle between incident and reflected x ray will be 2 theta.For enriching your knowledge you can go through the following DOI/article.
(Article:Electronic Supplementary Material (ESI) for RSC Advances This journal is © The Royal Society of Chemistry 2012 )
Regards,
M.O.Aquatar
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