The Rietveld method was originally developed by the Dutch physicist Hugo Rietveld (1932-2016) in 1966 for the crystal structure analysis of polycrystalline samples analogous to the Debye-Scherrer method using neutron radiation. It has also been used since 1977 for X-ray (XRD) examinations. Since the mid-1970s, the Rietveld method has also been used for the quantitative phase analysis, for the quantitative determination of the crystalline components of a powdery sample.
The Rietveld method was originally developed by the Dutch physicist Hugo Rietveld (1932-2016) in 1966 for the crystal structure analysis of polycrystalline samples analogous to the Debye-Scherrer method using neutron radiation. It has also been used since 1977 for X-ray (XRD) examinations. Since the mid-1970s, the Rietveld method has also been used for the quantitative phase analysis, for the quantitative determination of the crystalline components of a powdery sample.