I have tried to collect (transmittance and reflectance data) with a Filmetrics RT-10 spectral reflectometer on FDM printed t-glase thin film. However, an application engineer from the company stated this was improper usage of the machine due to the irregular surface of a 3D printed film.
Are there any methods out there currently accepted to measure transmittance and reflectance data of a FDM printed film?
I am specifically interested in the wavelength range of 300-1100nm.
Thank you for your time.
Use Spectrophotometer which have integrating sphere. read the attached article.
I think you can use an ATIR or FTIR spectrophotometer to measure transmittance as well as reflectance of your thin film. You may find more information from the following:
Article Optical Properties of Thin Films
Article Optical Properties of TiO2 Thin Films
http://iopscience.iop.org/article/10.1088/0034-4885/23/1/301/meta
Article Optical Properties of a-HfO2 Thin Films
https://books.google.com/books/about/Optical_Properties_of_Thin_Solid_Films.html?id=yfJjiZBAc-AC
You can use traditional laser ellipsometry (devices) and Brewster refractometry but just only if coherent (specular) beam reflection exist.
In the case of totally diffusive scattering it is possible to decrease given part of scattering by immersion of the considered surface up to appearance the named specular component and make above mentioned measurement taking into account effect of immersion.
You can take as a starting pointthe idea from the paper attached below
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