Dear colleagues,
I wonder if there is a method to transfer already cut thin-setions (that were analysed under the optical microscope) to SEM or TEM for further examination?
Thank you for advice,
Regards,
Tom Masselter
If your embedding material is PMMA, you can observe your sections (after conductive coating) under SEM with no problems. Or even better - observe stubs, from which sections were cut, with some staining, such as OsO4. For TEM you can reembed your sections and then cut ultrathin sections under shallow angle. PMMA behaves not really good under TEM beam, but still bearable. For paraffine sections there are some methods too (which I never used myself), but people usually report relatively poor end results.
As Dr Dusevich said, it will be easier to examine the face of the resin block. Just cut a piece of the block off, glue it to a SEM stub, gently polish it with a diamond knife if necessary, coat with about 10 nm of carbon, and then examine with an SEM in backscattering mode, when the working distance is as short as possible. Using this method, we reached almost TEM-like quality:
https://www.frontiersin.org/articles/10.3389/fcell.2021.672592/full
Good luck!
As per my understanding there is no direct way for transfer the samples for above mentioned microscopies. However, ideas by Prof. Vladimir and Pror. Korneev are really good and demonstrable
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