Suppose I have made a deposition on a thin film of one material of a hexagonal structure and another different. How to know a mismatch of these two material structures?
For corrected answer need know what type of materials you is deposited. What thickness of deposited layers? If you deposited semiconductor materials method of X-ray diffraction is good method for mismatch structures. Another possibility for structures analysis is transmission microscopy. For more details answer I need have more information
i have deposited a SnSe and TiO2 and i dnt know how can we found a mismatch of.structure using X-ray technique.
The mismatch can be calculate by the difference between lattice constants(a)
Mismatch=2(a1-a2)/(a1+a2)
The lattice constants can measure by xrd.
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