Muhammad Aslam, I have been thinking about what information you need to understand so that you see the answer in front of you. Here is a suggested program of study.

learn about:

The nature and generation of X-rays - particularly understand about wavelength.

The nature of solid matter, particularly crystalline matter. This should include symmetry groups, unit cells, space groups, atomic lattices and atomic planes, Miller indices. 

How X-rays interact with solid matter - scattering centres, constructive and destructive interference, THE BRAGG EQUATION.

Data collection - how to get the best from the diffractometer, selection of anode, monochromators, geometry, slits, detectors, scanning parameters (start, stop, step, speed). 

Sample preparation - awareness of preferred orientation, particle size, sample loading, homogeneity.

Data quality - background levels, noise level, sufficient counts, sufficient data density, sufficient angular range

Data interpretation - assessment of background for amorphous scattering, background removal, peak finding, compilation of d-values from peaks, comparison with databases using search-match procedures. 

These will cover the basics of qualitative X-ray powder diffraction and everyone who uses the method should be aware of all of this. Quantitative analysis is whole new ball game and requires different skills such as understanding the intensity equation, reference intensity ratios, Rietveld analysis.  Indexing and structure solution is again another step ahead. But get these basics down and you should understand your answer. 

I hope that helps.

Respected Aslam Ji

When we open JCPDS File we have to select the elements what we used in our study, than PDF numbers will be open in new home page.

We have to select each PDF Number and check weather the 100% peak is matching with other two peaks (d value) if it is matching we can label. 

Like wise we have to select each peak and check with PDF number.

I do not have particular software otherwise i will definitely help you.

All The Best  

Thank you 

Thank you Dear Anil Kumar Moola for sharing useful information. Regards

I don't quite see the problem here, as you have already identified the phase by matching the intensities of the peaks to the PDF pattern 033-0397, Chromium Iron Nickel Carbon, FeCr0.29Ni0.16C0.06. (There should be two more peaks at 90.7 and 95.95 2-theta).

Can you restate your question and let us know your problem.

Is it a question of converting a PDF card in d-value to a pattern in 2θ? If so, you'll have to convert each entry on the PDF card to 2θ based on the wavelength at which the pattern was collected:

$$ 2θ = 2 asin\frac{\lambda}{2d} $$

Ian J slipper my point is  to identify compound that represent each peak in attached figure? How can i know it. Regards

The three peaks all come from the one phase that has been matched to the PDF pattern.

I think you need to do a lot of reading and learn and understand powder X-ray diffraction so that you can understand how to interpret the diffractograms. Get some books, read. You can start by working your way through the very good information found on this website included in the link below. 

http://www.ammrf.org.au/myscope/xrd/introduction/

Muhammad Aslam, I have been thinking about what information you need to understand so that you see the answer in front of you. Here is a suggested program of study.

learn about:

The nature and generation of X-rays - particularly understand about wavelength.

The nature of solid matter, particularly crystalline matter. This should include symmetry groups, unit cells, space groups, atomic lattices and atomic planes, Miller indices. 

How X-rays interact with solid matter - scattering centres, constructive and destructive interference, THE BRAGG EQUATION.

Data collection - how to get the best from the diffractometer, selection of anode, monochromators, geometry, slits, detectors, scanning parameters (start, stop, step, speed). 

Sample preparation - awareness of preferred orientation, particle size, sample loading, homogeneity.

Data quality - background levels, noise level, sufficient counts, sufficient data density, sufficient angular range

Data interpretation - assessment of background for amorphous scattering, background removal, peak finding, compilation of d-values from peaks, comparison with databases using search-match procedures. 

These will cover the basics of qualitative X-ray powder diffraction and everyone who uses the method should be aware of all of this. Quantitative analysis is whole new ball game and requires different skills such as understanding the intensity equation, reference intensity ratios, Rietveld analysis.  Indexing and structure solution is again another step ahead. But get these basics down and you should understand your answer. 

I hope that helps.

Thanks Ian J slipper for sharing useful information

I think you can explore this link

http://www.instanano.com/characterization/d-value-calculation/xrd-d-value-calculation/