we have deposited the semiconducting thin film (CZTS) using sputtering. is it possible to obtain the crystallanity and strain in thin film using RAMAN spectra?
which formula should i use for that?
Yes! In general:
Crystallinity goes with peak width (more narrow the peak, greater the crystallinity). Also, if you can find data in the literature, you can give mode assignments, phase information, etc. You can also calculate the mode frequencies ab initio. If you can get the character tables, correlation tables, structure, and the modes, then this can help looking at the strain.
Stress/strain causes shifts in the peak positions. If you know the structure and peak positions of a bulk sample, you can calculate the strain. I have a paper that can act as a starting point (references, etc.):
Article Raman spectroscopy of La2NiMnO6 films on SrTiO3 (1 0 0) and ...
PM me for a copy.
An excellent Raman book is:
Infrared and Raman Spectra of Inorganic and Coordination Compounds, PartA
Kazuo Nakamoto
Some good references for Raman/strain are:
Stoehr, et al., PhysRevB 53(11) (1996) 6923
Lucazeau, et al., JRamanSpectrosc 34 (2003) 478
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