For ultra-thin films, how to determine the crystal structure? If it's a ferroelectric film, how do you determine its ferroelectric property? It would be better if it was a cheaper and simpler method.
For thin Nb-doped PZT thin films (30nm
thick), deposited on a bottom superconducting electrode, and having dot electrodes on top, making an MFM structure.
we could measure the ferroelectric properties easily, at liquid nitrogen temperature, rather than room temperature, because at very low temperatures the resistivity of the sample goes high, and we could easily apply the field for testing the P-E hysteresis loops. This work was published long long ago in Applied Physics Letters, on the thickness dependence Ec and Ps of Nb-doped PZT thin films. You can try this approach in case your think films are becoming leaky.
If tested at low temperature, the device performance at room-temperature does not seem to match. K. Sreenivas
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