Dear Researchers,

I had deposited amino acids on Si-wafers by sublimation at different temperatures. Now I want to know whether the layer contains monomers, polymers or fragmentation products. I found special ATR-IR spectroscopes to handle with wafers in literature, but I only have access to standard instrumentation for liquids and powders. If there is no way to check the structure directly on the wafers, I will dissolve the layers after finishing all characterisations and use standard NMR-, IR- and MS-techniques, but first I will look for the wafer layer conserving techniques. Perhaps somebody knows about an institution or research group in the region of Hamburg, Germany, with option for measuring with above-mentioned wafer holder containing ATR-IR spectroscopes. Please, let me know!

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