My point is " If i have tried to synthesize a material (composite of two) and it turns out to be a doping, but in atomic level, how can i check the level of doping?. and the doping doubt arise when i have an enhanced property and the dopant is not detected by XPS!
As far as one can see, Mr. Sankar Sasidharan currently works at the Tokyo Institute of Technology doing research on characterization of nanomaterials, and he has XPS in his research lab. XPS is useful for quantitative analysis of elements mainly at the surface (0-10 nm), but not in the bulk, where dopants are hardly detected by XPS. In this case, STEM methods can be useful to image dopants at the atomic scale.