If you "JUST GRIND YOUR POWDER AND RECORD XRD PATTERN" or if "you ground your powders well" and used "the Scherrer equation" (definitely NOT the non-existent mythical "Debye-Scherrer equations"), you'd estimate the "ground" diffracting domain size while neglecting the effects of:
Process induced nano structural damage
Preferred orientation
Shape of domain
Beware, certainly not the in situ "size" in the "unmolested" sample :-)
The Silicon powder samples were ball milled using high energy ball milling machine. I also studied TEM and SEM of the samples and found that powder particle size is in nanometer to sub-nanometer range. But the shape of particless is not circular but irregular. So I am not sure that Deby scherrer can give me correct crystallite size.
I need to know which method should i use to correctly measure the crystallite size ?
Pramod, Vijender & Ankit! You need to edit your prior posts or risk the impression that you aren't even reading previous posts or understanding simple English. You ought to consider yourselves fortunate to leverage the expertise of folks like Ken for free. Don't take it for granted. If you don't know how to edit your prior comments, I'll be glad to help explain. You'd fail your test if I was your PhD examiner. Please pay attention at least :-)
Debye was neither Scherrer's 1st name nor were they married to each other. You folks sound extremely ignorant using the term "Debye-Scherrer equation/formula" as do others on RG from many countries as well as venerated technical institutions. There is no such scientific term in XRD. Sounds like the famous "hot selling" bovine excrement patties (BS) from India. Please fix it or risk "down-votes" & de-edification to your alma mater! Mindlessly & gratuitously regurgitating or chanting erroneous technical information will not admit it into the scientific lexicon.
BTW the Debye-Scherrer technique is one the most basic photographic methods of acquiring powder diffractograms using a photodensitometer to quantify relative intensities. Many of you youngsters probably only have "book knowledge" of such antiquated methodology. The sample here is deliberately rotated in the beam about the diffractometer axis to "smudge" the effect of any residual preferred orientation. It has nothing to do with the Scherrer equation.
Happy New Year from beautiful Mysuru, lndia for now! Post your data for effective use of RG expertise.
"scherre formula gives you crystallite size due to broadening of the peak"
Scherrer formula may be used to estimate relative "size" employing well known calibration standards & conventional diffractograms while ignoring "grinding" induced coherent diffraction domain size changes as well as any preferred orientation in samples.
SEM and TEM data may be utilized to better estimate the "nebulous" Scherrer shape factor, I'd guess.
Here's another example to exorcise the DS demon. Read comments by Edward Andrew Payzant.
Your comments are moreover mocking sort of then helpful. Those comments are not helping me.
If you understand my problem then please reply in proper manner. I am heartily grateful to you and other experts for giving the precious time to my problem. But I think this is the purpose of ResearchGate, isn't it?
Anyway I will do it by my own as either i am unable to explain my problem or you are more prone to mock me than help me.]