I am doping Nafion membranes with tungsten-containing molecular additives. I would like to measure the concentration (in wt%) of these additives inside of the membrane using x-ray fluorescence. What is a strategy to accomplish this where the thickness of the analyzed membrane does not matter?
Please see section D of my answer in your question:
https://www.researchgate.net/post/What_energy_value_do_I_use_to_determine_the_mass_attenuation_coefficient_for_an_element
X-ray absorption/attenuation is used instead of XRF there.
Hi Alex, From my point of view, I would use two analytical approaches to address the problem you pose. First, I would try the total acid digestion of the membrane by means of a microwave technique at high pressure and temperature using mixtures of the type HNO3: HCl: HF (3: 1: 1). Once digested, I would evaluate the percentage by weight of W in the membrane in an absolute way. The second approach would be to carry out the direct analysis of the same untreated membrane and associate the integrated W signal with the concentration of W in wt% previously calculated. In this way, using various concentration points, a calibration curve for the analysis of W in wt% could be obtained by direct measurement of the integrated signal of W. I hope I have been able to help you.
- Badges
- Science topic