Hello,
I am doing XRD and the only available sample holder is a glass holder, my sample is a thin film so I am getting a huge amorphous peak from glass as well. Is there anyway I can modify the glass holder in order to reduce the background from it?
Many thanks,
Fatima
A rather simple way to go about this is as follows:
1) Do XRD for the glass sample holder only, you will see a broad amorphous peak between 20-35 deg.
2) Do XRD for the thin film on the glass plate
3) Subtract the data of the thin film on glass holder (2) from the data of glass holder only (1) and you will get the XRD for your thin film only.
A rather simple way to go about this is as follows:
1) Do XRD for the glass sample holder only, you will see a broad amorphous peak between 20-35 deg.
2) Do XRD for the thin film on the glass plate
3) Subtract the data of the thin film on glass holder (2) from the data of glass holder only (1) and you will get the XRD for your thin film only.
Dear I ask you Is the thin film crystalline or amorphous if amorphous like glass it is very difficult but if crystalline I agree with the first answer
I also agree with the first answer as there is no "direct" way to minimize the the diffraction signal caused by amorphous material. All you have to make sure is, that you have a sufficient count rate (-> counting statistics). Especially if you not only want to know what phases are in your sample, but also how much of it (assuming the material is holocrystalline, if not it gets a bit more complicated).
May be, if your film material is thick enough, you can try to add more layers, so that you can reach a sample thickness that gets nearly infinite for your wavelength. In addition, if your machine is equipped with a variable slit, you should make sure that your xray beam is focused only on the sample, not on the glass holder.
For thin films a grazing incedence setting should be used: when the incident angle is just above the critical angle, the penetration depth of x-rays in the z-direction is minimized, thus reducing background signal. If that is not enough to get data above the detection limit, most diffractometers allow for a spot size setting, that can be used to narrow the width of the iluminated area, but his would probably require a compensation in aqcuisition time.
As Aisha pointed out, taking a XRD spectra for the holder allows you to set that as background, but as Shalabi mentioned, if the sample itself is amorphous the xrd spectra will be almost identical to that of the holder.
I want to ask, what is the XRD target Mo or Cu.
If Mo the XRD hamp is very high. If Cu I confirm the first answer of Dr. Aisha Tanvir.
I want to confirm the background can be identify by XRD software and subtract directly from the data of any sample.
Dear Fatima,
Try to use the frame as holder for transmission mode XRD. The size of this frame would be larger then the X-ray spot of your diffractometer.
Use plexiglas or mica holder.
Sincerely, Michael
hi freinds
\how are you?
can you help me about the xrd patterns?
this is my xrd patterns and i confused about the backgroud because my alloy create with high cooling rate and probably have a amorphous sturcture with crystall structure.
why the backgroud of my xrd pattern incresed?
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