d spacing can be calculated by the Bragg's law:

λ  =2dsin(Ɵ)

where λ is the wavelength of the X-ray beam , d(d spacing) is the distance between the adjacent   sheets or layers,Ɵ is the diffraction angle.

 A weak and broad diffraction peaks can be observed in the XRD patterns of  graphene oxide  .The increasing  in d spacing of graphene oxide  is due to the oxygen –containing functional groups intercalate in the interlayer of graphite which relates with sufficient exfoliation of graphite flakes.

The broader the  graphene oxide peaks   the higher  are  d spacing values. Characteristics like optical properties , dispersion, surface area,morphologyand conductivity  may be change on changing of d s

d spacing can be calculated by the Bragg's law:

λ  =2dsin(Ɵ)

where λ is the wavelength of the X-ray beam , d(d spacing) is the distance between the adjacent   sheets or layers,Ɵ is the diffraction angle.

 A weak and broad diffraction peaks can be observed in the XRD patterns of  graphene oxide  .The increasing  in d spacing of graphene oxide  is due to the oxygen –containing functional groups intercalate in the interlayer of graphite which relates with sufficient exfoliation of graphite flakes.

The broader the  graphene oxide peaks   the higher  are  d spacing values. Characteristics like optical properties , dispersion, surface area,morphologyand conductivity  may be change on changing of d s

I need the d-spacing and (hkl) for STEM electron diffraction pattern indexing. Thank you for your answer. I know how to calculate d-spacing, but I also need the (hkl) values

ِPlease  have a look at  links.

https://www.researchgate.net/post/How_to_determine_the_hkl_index_with_the_XRD_result

https://www.researchgate.net/post/Miller_index_of_XRD_pattern_of_reduced_Graphene_Oxide_rGO

One can check the h k l values of any material from their corresponding data cords available on the software and you can get along with XRD data,

One can calculate the h k l values of any material with the help of formulas given in material book,

you can compare the 2-theta values observed in your experiment with the reported values

As for graphene, there is no d-spacing.

I agree with Dr.Hassan

Dear Raluka;

The basal interlayers of the graphite and graphene oxide are estimated from the position of the d002 plane peak in the X-ray diffraction intensity profile using Bragg’s law. Please see the above links:

DOI: http://dx.doi.org/10.1590/1980-5373-MR-2015-0528

DOI: 10.1088/0256-307X/30/9/096101

DOI: 10.3390/s16010103

For the Miller index (hkl) you can use XRD software like Xpert's High Score, Match software (Free online).

Best Regards

Dear Ijaz Ahmad Khan

Which software you prefer for hkl values determination