I would like to know what are the characteristic d-spacings and respective Miller indices for graphene, graphene oxide, reduced oxide graphene and graphite.
where λ is the wavelength of the X-ray beam , d(d spacing) is the distance between the adjacent sheets or layers,Ɵ is the diffraction angle.
A weak and broad diffraction peaks can be observed in the XRD patterns of graphene oxide .The increasing in d spacing of graphene oxide is due to the oxygen –containing functional groups intercalate in the interlayer of graphite which relates with sufficient exfoliation of graphite flakes.
The broader the graphene oxide peaks the higher are d spacing values. Characteristics like optical properties , dispersion, surface area,morphologyand conductivity may be change on changing of d s
where λ is the wavelength of the X-ray beam , d(d spacing) is the distance between the adjacent sheets or layers,Ɵ is the diffraction angle.
A weak and broad diffraction peaks can be observed in the XRD patterns of graphene oxide .The increasing in d spacing of graphene oxide is due to the oxygen –containing functional groups intercalate in the interlayer of graphite which relates with sufficient exfoliation of graphite flakes.
The broader the graphene oxide peaks the higher are d spacing values. Characteristics like optical properties , dispersion, surface area,morphologyand conductivity may be change on changing of d s
I need the d-spacing and (hkl) for STEM electron diffraction pattern indexing. Thank you for your answer. I know how to calculate d-spacing, but I also need the (hkl) values
The basal interlayers of the graphite and graphene oxide are estimated from the position of the d002 plane peak in the X-ray diffraction intensity profile using Bragg’s law. Please see the above links: