As far as I know, measurement errors introduced by the test-fixture is systematic, the calibration process is a means to cancel the systematic errors. So I think whatever the test-fixture is, as long as it does not introduce too much attenuation/ resonation such that the signal power is below VNA’s sensitivity, the VNA shall obtain reliable measurement results.
I am now trying to design a custom test-fixture and its corresponding TRL calibration kit. But I find the test-fixture has great impact on the TRL calibration. I don't know what went wrong. Can you help me to analyze this problem?