I have a mixture of a perovskite on alumina support. After synthesis the peaks are visible, but the intensity is relatively low as compared to the 100% perovskite sample.
Will loading more perovskite on alumina helps to improve the peak intensity?
I'm guessing you might want to do ICDD card. The concentration of one material do effect the XRD peak intensity, but the area under the diffraction peak should be more concerned.
Probably not, since the XRD peak intensity depends on the degree of crystallinity of the sample.
An alumina sample holder is not a good option. It it not possible to replace it with something else? Glass will also be a slightly better option. If the sample on the holder is small, then it is necessary to measure for a very long time. The best is a special low-background holder made of pure Si single crystal.
Dear Prabhsimran Singh ,
I fear, that a direct answer to your question has been only given partly up to now.
Your questions can be separated into two parts:
a) Peak intensity (better 'peak integral' as suggested by Denghui Ji) dependence on the relative contribution of your perovskite to another material component in your sample:
Answer: with increasing relative perovskite contribution compared to another material component in your sample the peak heights (peak integrals) of perovskite will increase. For similar x-ray attenuation coefficients of perovskite and the other material component there is a linear dependence on the concentration for the peak intensity. Maximum intensity will be achieved for 100% perovskite in your sample.
b) Peak intensity (peak integral) dependence on the sample thickness (or mass coverage) on top of the substrate:
Answer: peak intensity (peak integral) increases for increasing sample thickness, but a saturation is observed due to the limited penetration depth of the x-rays. Thus for small perovskite coverage the peak heights will increase, when further increasing the amount of material placed on the substrate; but infinitely height peaks will not be achieved.
The dependence I/Imax of the peak heights as a function of the sample thickness d can be described by a function of the following type:
I/Imax = 1 - exp(- .. d ...)
As a good excercise you may develop this d dependence by your own, taking the x-ray attenuation coefficient µ of the sample material into account as well as the Bragg angle theta.
The result is given in my answer at:
https://www.researchgate.net/post/Why_XRD_peak_intensity_increases_with_the_films_thickness_Is_there_any_fixed_relation_between_XRD_peak_intensity_and_thickness
Final remark : powdered sample material is considered, thus no peak intensity variations due to preferred orientation...
Good luck and best regards
G.M.
Dear Prabhsimran Singh, please with your raw data or screenshot of your diffractogram/diffraction pattern.
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