hello.
I want to obtain a plot of the sputtering rate according to the angle of the sample with the incident angle of the ion beam fixed.
In this case, I think that should calculate using "Ions with specific energy/angle/depth (full cascade) using TRIM".
To do that, I need to create a TRIM.DAT.
However, a TRIM file can only contain information about the location and orientation of ions, not the sample.
Please advise on how to obtain the sputtering rate according to the angle of the sample.