I want to get the relationship between Incident angle and sputtering yield through SIRM simulation. How can I get the attached graph?
If possible, can you also tell me how to get a graph of sputtering yield when I fix the beam direction to 0 degrees and change the angle of the sample?
always thank you
- Graph
Kim, H. B., Hobler, G., Lugstein, A., & Bertagnolli, E. (2007). Simulation of ion beam induced micro/nano fabrication. Journal of Micromechanics and Microengineering, 17(6), 1178.