During Pulse Laser deposition of Pt thin film, I observe the XRD intensity continuously increasing. The number pulses are same for each deposition (which means rate of ablation is same for all deposition).  If the ablation rate is same Intensity should be same for every deposited thin film but it was not. I was changing the substrate temperature form RT to 600C for each deposition. Is this question is justified by crystallinity of the thin films because i Observe that FWHM decreasing at 600C?

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