Multilayer film is prepared by a linear polymer and 20 nm diameter polymeric micelle. We want to show the structural changes in micelle at different film depositing conditions. We tried cross-sectional SEM but film thickness was too small to see such detailed structural changes.
Hello,
You may go through the given link below to find a way to analyze your multi-layer thin film. Article Structural Analysis of Porphyrin Multilayer Films on ITO Ass...
When you say structural changes do you mean chemically different structures or just physical arrangement?
Though it may be hard but GI-SAXS might be a good option, though it typically requires time at a synchrotron. As Jalal Uddin suggested ATR-IR may work if you have a specific chemical change that you can measure. Dynamic SIMS may also work, though it is very easy to damage polymer films by this method ideally you would use a cluster source as the sputtering beam. And finally you may be able to get higher spacial resolution if you use TEM with cross-sectional samples.
Not chemical. Physical changes occur. At acidic pH film thickness is lower and at higher temperature film thickness is higher because micelles has more globular shape due to contracted coronal chains.
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