I don't want to special order them due to the expense.I need to test a device that is similar to an ellipsometer. I need standards to test my device, however, I need the standard substrates to be either NBK-7 glass or quartz with materials deposited on them that are non-absorbing and have a refractive index less than them respectively (less than 1.52 at 532 nm for NBK-7 glass and less than 1.46 at 532 nm for quartz).
Or, I'd like to know how to easily and inexpensively deposit a film on those surfaces with the same requirements (with a suggestion of what to deposit).
There are thin film standards and reference samples available, but most of them are simply SiO2 thermal on Si as this system is especially suitable as thin film standard for several reasons. Also, these standards are quite expensive because what you really buy is the effort for certification. If you do not need a certificate you can buy oxidized Si substrates and ask someone with a well-calibrated ellipsometer to give you a precise thickness. The materials you want are as far as I know not available as standards, and the low-n coatings can be expensive to buy as a job coating. The question is, if you really need these systems to test your instrument or if you could use cheaper samples. Also, glass substrates are not so easy to measure accurately with an ellipsometer.
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