AFM is basically constructed on the principle of force of attraction and repulsion due to vander-waal forces between atoms. They form temporary dipoles. Force of repulsion is very strong as distance goes to below 10nm. The clarity of your image is depends upon the mode you are using whether contact mode, non-contact mode or tapping mode. Every mode has its advantages and disadvantages. In contact mode, the resolution is very high as it goes and directly touches to your surface, but it damages the surface also. contact mode does not affected by moisture(like environmental conditions) In case of non-contact mode the resolution is less as tip is away from the surface but it does not damage the surface. As well non-contact mode get affected by environmental conditions. That is why new type of mode is introduced known as tapping mode, which gives high resolution without damaging surface.
the main advantage of AFM is height parameter which is not possible with convention microscopy method. The resolution in AFM is 10 times more than electron microscopes. The resolution is very high as compared with electron microscopy. The lateral resolution is very high. The normal resolution is higher that lateral resolution while normal resolution is not observed in electron microscopy.
AFM can used in variety of applications. It can measure almost all types of characterization of materials. It can measure mechanical, electrical, chemical, physical, thermal properties of materials.
The intensity of colors is qualitative measurement of the property of the material which is interacting with the tip surface using atomic forces between them. Thus the color is depending upon sample material-tip material interaction. but its variation represent the qualitative representation of quantitative measurement of specific property to be measured.
AFM is basically constructed on the principle of force of attraction and repulsion due to vander-waal forces between atoms. They form temporary dipoles. Force of repulsion is very strong as distance goes to below 10nm. The clarity of your image is depends upon the mode you are using whether contact mode, non-contact mode or tapping mode. Every mode has its advantages and disadvantages. In contact mode, the resolution is very high as it goes and directly touches to your surface, but it damages the surface also. contact mode does not affected by moisture(like environmental conditions) In case of non-contact mode the resolution is less as tip is away from the surface but it does not damage the surface. As well non-contact mode get affected by environmental conditions. That is why new type of mode is introduced known as tapping mode, which gives high resolution without damaging surface.
the main advantage of AFM is height parameter which is not possible with convention microscopy method. The resolution in AFM is 10 times more than electron microscopes. The resolution is very high as compared with electron microscopy. The lateral resolution is very high. The normal resolution is higher that lateral resolution while normal resolution is not observed in electron microscopy.
AFM can used in variety of applications. It can measure almost all types of characterization of materials. It can measure mechanical, electrical, chemical, physical, thermal properties of materials.
The intensity of colors is qualitative measurement of the property of the material which is interacting with the tip surface using atomic forces between them. Thus the color is depending upon sample material-tip material interaction. but its variation represent the qualitative representation of quantitative measurement of specific property to be measured.
As already presented in the long but excellent answer below , colours in AFM are false. they are pure inventions to highlight variations of a signal along two axis X and Y of the surface. Colours usually follow a code that is shown on the right of the image , called lookup tables (LUT) with different conventions (usually black to yellow with brownish hues) depending on the manufacturer and of the taste of the scientists.
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