In XRD, you measure the size of coherently diffracting domains (coherency length), not strictly the same as grain size. If your grains have defects/stacking faults etc the coherency length can be much smaller than the actual grain size.
Or, as the prvious poster said, it can be the instrument broadening. 600 nm grain size should give a negligible broadening.
In XRD, you measure the size of coherently diffracting domains (coherency length), not strictly the same as grain size. If your grains have defects/stacking faults etc the coherency length can be much smaller than the actual grain size.
Or, as the prvious poster said, it can be the instrument broadening. 600 nm grain size should give a negligible broadening.
Thank you Dr. Dominique for your comment. I've applied the background correction as well. Further regarding Prof. Eklund comment I found it interesting since TEM and XRD studies are complementary hence there's possibility of getting greater particle size is acceptable. Dr. Rawle thanks for your comment and if possible kindly share some articles that deals with the applicability of Scherrer equation. Thank you.
"What is the probable reason for getting 600 nm NC in bulk TEM whereas XRD Scherrer equation gives us 50 nm as crystallite size?"
Inconsistent model and assumptions. Specifically, the "shape" factor.
Failure to convert FWHM to "Integrated Breadth", β in Radians, used in the Scherrer equation.
Presence of "preferred orientation".
XRD measures the 3D CDD (coherently diffracting domain) size, "crystallite size". This is not the same as "grain size" or "particle size". As P. Eklund suggests. There are several other RG discussions about this subject with copious pontification. TEM requires a lot of sample prep and is a cross-sectional measurement, isn't it?
Not sure if TEM is sensitive enough to quantify small variations in local crystallographic tilt/twist. Extrapolating over a large area may not be trivial.
Typical sampling volumes with XRD and TEM are "miles apart". Several orders of magnitude!
If you share more information about the chemistry and processing history for your sample, you should get better feedback from the RG expertise. Posting your XRD data and TEM micrographs will make it more interesting to the rest of us as well :-)
"K is a dimensionless shape factor, with a value close to unity. The shape factor has a typical value of about 0.9, but varies with the actual shape of the crystallite;"
Is the "shape factor" an empirical parameter? "woodoo XRD" or is there a method to the choise for the value?
Can one detect an average shape factor better using supplementary SEM, TEM or 2D XRD observations?
Besides, preferred orientation & defect morphology will affect the "shape factor" also.
Can these individual components controlling the changes in the shape of the "Bragg Profile" be potentially deconvoluted?