The conventional methods for determining K(IC) values cannot be applied to thin films as the plane strain conditions are not met. What is the next best way to characterize the stress intensity factor of such films in a reliable/repeatable way? Is there a detailed study on the dependance on the K(IC) values on the thickness? By what magnitude will the K(IC) values vary if the plane strain conditions are not met?
Farhan Ansari
Great, thanks. I have done a bit of reading about EWF but my impression was that it is valid for materials with stable crack growth. I have a material which shows yielding but the crack growth is catastrophic.
PS: I couldn't open the links you sent. Can you please write the references (title, author etc).
Thanks,
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