I am in search of a low cost, widely used and widely accepted characterization method/test to determine I-V (current-voltage) characteristics of semiconducting thin films. Thank you.
The most reliable way is to pattern the film in a shape of a Hall bar and measure the 4probe resistance as a function of the applied current. If there no way to pattern the film Van der Pau technique is the way to go. If by IV you mean dependence on the gate voltage, then you have to do the above as function of Vg