Characterization of some samples show a hump in the base line. Does it actually signify something or may be attributed to instrumental error?
A "hump" in the baseline usually indicates the presence of an amorphous material in the sample.
A "hump" in the baseline usually indicates the presence of an amorphous material in the sample.
It might be also related to the sample holder you are using. Can you exclude this? Which kind of sample holder you are using? Metal, plastic, single crystalline Si? The last is from my point of view the best if Si is cutted in a way that it does not give any Bragg intensity.
Yes actually in xrd results u may get some picks or humps these are show the presence of the particular material like may be in your sample more materials are present like amorphous silicon, carbon, and etc. So hump is due to this
As mentioned above, both X-ray amorphous phases and sample holders (or sample supports/substrates depending on how thick your sample is) made of X-ray amorphous materials can give a 'hump' in the diffraction pattern. Like peaks from crystalline phases the position of the hump will vary depending on what it comes from, so for example a hump from a glass is in a different place to a hump from an organic material, this can help you to identify the source of the hump.
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction