The XRD graph is provided. There can be seen a peak at around 2TH=10.2 (which is the most significant peak for Go-SiO2 in many other articles), but what about the peak at around 2TH=14.5?
It is definitely not the devitrification of SiO2. So that GO variations remains. The google image search: "GO XRD" showed that with heated and moisture absorption the peaks shift. And GO can form graphene oxide (RGO).
https://link.springer.com/article/10.1007/s40097-019-00324-x/figures/1
and
http://www.materialsciencejournal.org/wp-content/uploads/2017/07/Vol10_No2_XRD_Man_Fig9.jpg
Papers
https://link.springer.com/article/10.1007/s40097-019-00324-x
and
http://www.materialsciencejournal.org/vol14no1/xrd-hta-uv-visible-ftir-and-sem-interpretation-of-reduced-graphene-oxide-synthesized-from-high-purity-vein-graphite/
As well as
In addition, there is a main peak at 2θ of 12.1° in GO(2) and 10.6° in GO(1), corresponding to d-spacing of 0.73 and 0.83 nm, respectively. This peak is similar to the typical diffraction peak of GO and is a possible indication of the presence of interfew-layered graphene containing defects [27]. GO(1) has a larger interplane gap than GO(2), revealing its higher oxidation degree compared to GO(2).
Article Influences of graphene oxide support on the electrochemical ...
I agree with Mikhail Zimin, that the G-SiO2 might have absorbed moisture, hence first check it's stability using TGA/DTA. Once if you find a change in the TGA curve, calcinate the sample to the same temperature or use the same TGA/DTA run sample and record the XRD, you may get the expected result.
Dharmadoss Sornadurai Dear Mr. Sornadurai. I'm thankful for your attention and guidance. I'll try out that procedure.
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