knowing that the structure is generated using Sprocess
I'm trying to simulate HCI degradation in an LDMOSFET using the SHE model. the simulation converges and the transient part is done correctly. However, in the log file i see this error occur multiple times :
'' Unable to save dataset 'TrapOccupation_0(Fi,Le)':
interface 'Silicon_1/Oxide_1.1' not found in grid file n15_fps.tdr ! ''
knowing that the structure is generated using Sprocess, How to solve this issue?
Thanks.
[EDIT]
In the final device remesh , add this to the Sprocess script:
refinebox interface.materials= "Silicon"
You will notice a new material called "interface" when visualizing the structure, and all error messages will not show up in next simulations.
Has your problem been solved? I am also simulating hot carriers and encountered the same problem. Can you help me?
yeah,it's because of the naming issue ,sdevice would automatically specify the region name as region_1 or region_2 if you have used the region name before .
[SOLVED]
In the final device remesh , add this to the Sprocess script:
refinebox interface.materials= "Silicon"
You will notice a new material called "interface" when visualizing the structure, and all error messages will not show up in next simulations.
In addition, several scalar distributions will have non-zero values.
Xinyi Zhang
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