Basically I have one or two very basic queries on temperature dependence of carrier concentration. As per book chapter 14 from the book "Physical Foundations of Solid-State Devices" & also from journal paper entitled "Shallow and deep donors in direct-gap n-type AlGaAs:Si grown by molecular-beam epitaxy" temperature dependence of carrier concentration for dual dopant energy level model (both donor type) at high temp can be described as:
nNDD+= (1/2)*NDDNcexp(-Edd/kT) [At high temp]
-> n(n-NSD)=(1/2)*NDDNcexp(-Edd/kT)
-> n2 - nNSD-(1/2)*NDDNcexp(-Edd/kT)=0 ......................(i)
where, NSD & NDD are the concentration for shallow & deep donor level respectively & Edd & Esd are deep & shallow donor ionization energy respectively.
One of the root of equation (i) will be n=[NSD + sqrt(2NDDNcexp(-Edd/kT))]/2
For high temp (T) regime,
exp(-Edd/kT) >> 1 & also NDD (Deep donor density) >> NSD (Shallow donor density)
Therefore, product of those above two: NDDNcexp(-Edd/kT) >> NSD2
-> sqrt(2NDDNcexp(-Edd/kT)) >> NSD
Thus root of equation (i) can be written as n = sqrt(2NDDNcexp(-Edd/kT))/2
= sqrt(NDDNc/2) exp(-Edd/2kT)
= n0 exp(-Edd/2kT) [at High Temp]
On the other hand, nNDD+ = (1/2)*NDDNcexp(-Edd/kT) can also be written as,
-> nNDD = (1/2)*NDDNcexp(-Edd/kT) [Since, at high temp, NDD+ = NDD as almost
all deep donor atoms become ionized]
-> n = (1/2)*Ncexp(-Edd/kT)
-> n = n0 exp(-Edd/kT) [at High Temp]
Therefore, at high Temperature, carrier concentration as function of deep donor ionization energy Edd can be written as either n = n0 exp(-Edd/2kT) or n = n0 exp(-Edd/kT).
Therefore, my significant query is which one is true for temp dependence of carrier concentration in case of dual dopant energy level model at high temp,
(i) n = n0 exp(-Edd/2kT)
or, (ii) n = n0 exp(-Edd/kT)
Kindly suggest the correct option. Your suggestion will be quite helpful for my research.
For your kind convenience I am attaching the reference book chapters & papers with necessary highlighted with yellow colour.