Dea CItra Kharisma JCPDS card numbers for MoS2 phases: 2H (hexagonal) phase uses Reference code: 00-037-1492, while the 3R (rhombohedral) phase corresponds to Reference code: 00-006-0097.

When you are really interested in this type of material and their diffraction phenomena, earnestly dig into the X-ray diffraction phenomena of layered materials which is far richer than contained in the "JCPDS" cards. Stacking is virtually never ideal, so you have to understand more than diffraction from ideal structure. So keep away from these cards and instead learn how to simulate diffraction patterns from ideal crystals (e.g. within Rietveld refinement) and from faulted crystals using tools like Diffax. Learn also to critically evaluate diffraction data including also effects like texture.

It is advisable to use the X'Pert HighScore software for X-ray Diffraction (XRD) analysis, as it contains the ICDD and PDF libraries, allowing you to retrieve and match the relevant JCPDS card for your reference.

What Abdul Muneeb recommends is in my view a part of the problem (apart from that the he recommends a specific commercial software, which requires licencing as it is the case for the PDF libraries): While such tools definitely can be used as inspiration/start for the true evaluation of the patterns, this can only be a first step. But too many people stay there I and I have see very many totally wrong evaluations of XRD data based on such methodology.