In another one of your questions I cited the Seah/Dench escape path data. Electrons whose escape path is longer due to their kinetic energy will give information from somewhat deeper ranges, but you will not turn XPS into a bulk sensitive method by that.
The associated information is better reached by EXAFS/XANES which are truly bulk sensitive, but of course these require a synchrotron.
With higher kinetic energy one have an higher escape depth of the electrons. So it is in opposite of your assumption.
Please keep in mind, that XPS measurements with Al- / Mg-source are analysing only the approximately 10 uppermost atomic layers of a sample. And 10% to 30% of the signal is the contribution of the first layer on top.
For samples, which are not prepared under high vacuum condition, but transferred from ambient air to the instrument, the composition of this layer is unpredictable.
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