Is it possible to use Scherrer's formula to calculate crystallite size of spin coated thin film
Yes it is possible, you can check this Chapter:
Chapter Spin-Coating Technique for Fabricating Nickel Zinc Nanoferri...
Absolutely. Generally, spin-coating does not ensure unidirectional growth. Hence, the X-ray diffraction pattern should be of normal polycrystalline powder-type nature. So, there is no exception associated for use of Scherrer's formula or Williamson-Hall equation for calculation of crystallite-size.
thin films in any techniques can employ sherrer's formula to calculate the average crystallite size but if you want more precise you must correct utilizing Lorentzian distribution as you can see in the pdf attached
Sure ,you may use Scherrer's formula to study the characteristic structure of all prepared thin films by different techinques such as spin coating ,spary pyrolysis ,dip coating ,evaporation ,etc....
Yes, you can apply Scherrer's formula to calculate crystallite size for any technique. It is independent on technique. Crystallite size is dependent on dimensionless shape factor; X-ray wavelength; line broadening at half the maximum intensity (FWHM), and the Bragg angle.
Yes, it is possible. The technology has nothing to do with the calculation of the Shearer equation. The important thing is that you have a thin polycrystalline or single crystalline film.
If, however, the film is very thin then you often get columnar growth and so the shape factor in the Debye-Scherrer formula needs to be taken into account if teh crystallites are all long and thin.
Yes, you can apply Scherrer's formula to calculate crystallite size for any technique. It is independent on technique. Crystallite size is dependent on dimensionless shape factor; X-ray wavelength; line broadening at half the maximum intensity (FWHM), and the Bragg angle.
yes, It is possible.
if a thin film is homogeneous then Scherrer's formula can give more reliable data.
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