Let's suppose I have an STO substrate and I have deposited a thin film of another material and it is highly oriented and STO as well as my material both form are cubic.
- To better understand the quality of the thin films I want to perform RSM. Kindly let me know how is RSM performed experimentally. How are asymmetric planes of substrate and thin-film probed in asymmetric RSM?
- How are details such as mosaicity, curvature, lattice parameters, strain and dislocations obtained from the experimental data?
Go through this discussion:
https://www.researchgate.net/post/What_information_can_we_get_from_reciprocal_space_maps_of_the_XRD_and_how_to_do_the_scan_in_XRD_to_get_reciprocal_space_maps
Dear Kamal
Please read the following articled. Hope that you will get the best answer for your queries.
Article X-ray diffraction reciprocal space mapping study of the thin...
Article High resolution X-ray diffraction mapping studies on the dom...
https://www.blue-scientific.com/large-area-reciprocal-space-mapping/
https://www.malvernpanalytical.com/en/products/measurement-type/reciprocal-space-analysis
https://www.rigaku.com/applications/bytes/xrd/smartlab/1119947204
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