One of the following you may use according to condition of the film.
Film thickness can be checked by
there are many techniques to measure film thickness:
1- An interferometric method, more details is available at: TOLANSKY S. Multiple beam interferometry of surfaces and films. London: Oxford University Press, 1988: 147.
2- Using mass of the film, m according to the next details::
W1 is the weight of cleaned substrate
W2 is the weight of cleaned substrate plus film
W2-W1= the weight of the film
ΔW=mg
m = ΔW/g
m=ρXV ; ρ, is the density of film material and V is the volume of the film
the Volume = (Width X Length X Thickness) of the film
One of the following you may use according to condition of the film.
Film thickness can be checked by
there are many techniques to measure film thickness:
1- An interferometric method, more details is available at: TOLANSKY S. Multiple beam interferometry of surfaces and films. London: Oxford University Press, 1988: 147.
2- Using mass of the film, m according to the next details::
W1 is the weight of cleaned substrate
W2 is the weight of cleaned substrate plus film
W2-W1= the weight of the film
ΔW=mg
m = ΔW/g
m=ρXV ; ρ, is the density of film material and V is the volume of the film
the Volume = (Width X Length X Thickness) of the film
You have to calculate first, wieght of the thin films before and after deposition (annealed films). i. e. simple weight difference method. Use the formulas
Density = Mass/Volume
Now, it is essential to calculate Volume.
Volume = Length x Width x Thickness
Density = Mass / (Length x Width x Thickness)
Using the above equation it is possible to calculate the thickness