How can I measure the transition metal oxide thin film electrical property, especially for some low conductivity film like MoO3.
Refer to the following:
-K.Habib,” Measurement of surface resistivity and surface conductivity of anodised aluminium by optical interferometry techniques”, Optics and Laser Technology, Vol.44 (2012) 318-321.
K.Habib,” Measurement of volume resistivity/conductivity of metallic alloy in inhibited seawater by optical interferometry techniques”, REVIEW OF SCIENTIFIC INSTRUMENTS 82, 034103 (2011).
you need a nanoampermeter or nanovoltmeter with a stable variable power supply. Then it is simple as Ohm law experiment, you can find it in net.
You need a very sensible apparatus to perform accurate measurements, as suggested by Sadeq H. Lafta, But most important is the sample structure and the measurement configuration. It is too long to explain all here, but I suggest you to search for Van der Paw method/configuration, which takes in the proper account the influence of the contact resistance of electrodes with your sample surface. Moreover, just take into the due account surface contact geometry because dealing with low-conductive films a large current crowding effect at contacts may be expected (which is detrimental to your measurements), and consider the possibility of rectifying behaviour at contacts as well (light may also play a role)
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