Hi,
I deposited around 150nm Nickel on a silicon nitride layer, and I would like to know about the magnetization properties of the thin film (i.e Nickel). Would it be possible to do so by ellipsometer device? or Do you have any suggestion to understand the properties by any other straightforward methods?
Thank you so much in advance for your suggestions
Andre, Jean-Jacques, Karol Holczer, Pierre Petit, Marie-Thérèse Riou, Christian Clarisse, Raymond Even, Marc Fourmigue, and Jacques Simon. "Electrical and magnetic properties of thin films and single crystals of bis (phthalocyaninato) lutetium." Chemical physics letters 115, no. 4-5 (1985): 463-466.
Dear Milad Shojaeian , I think that the magnetic properties of thin films can be measured via the measuring their magnetic permeabilities. On the other hand, the magnetic permeabilities of thin films can be measured via the measuring of the index of refraction of electromagnetic waves (if thin films are transparend for these waves) in the presence of an external magnetic field.
You can do the magnetization measurement (M-H characteristics) with your deposited films on substrates. You can also do same study for your substrates alone and after subtracting the substrates contribution from the M-H characteristics of your structure, you can get the magnetic response of your film. During magnetic measurements, you have to keep the all required parameters same.
thanks & regards,
Arvind
Dear Milad,
In order to get access to magnetic properties of your Ni thin films, you have to carry out the hysteresis loops of your film(M-H curve). You can do it using Vibrating Sample Magnetometer(VSM) or Alternating Gradient Fied Magnetometer (AGFM), or SQUID...The obtained magnetization curve displays the variation of the magnetization M(in electromagnetic unit(emu)) versus the applied magnetic field. In order to obtain M in emu per cubic centimeter, you have to divide the values depicted in the vertical axis by the volume of your thin layer.
This curve provides you with the saturation magnetization of your film(it is the highest value of M displayed by the curve) as well as the coercive field(coercivity) which is the value of the magnetic field when M becomes zero.
Best regards
Look at the work of this team, they are engaged in magnetic ellipsometry, this is what will help you
https://doi.org/10.1134/S0370274X19150037
https://doi.org/10.1016/j.jmmm.2016.12.073
- Badges
- Science topic
- Similar topics
- Chemistry
- Nanotechnology
- Nanostructures
- Thin Films