We have thin polymeric films containg luminescent nano- or micro-crystals (crystalline particles activated by luminescent ions). The sample (film) is on the glass substrate (coverslip). I would like charaterize of these films in terms of the optical properties. I know about the characteristic bands of my crystals in form of bulk (single crystal), but for thin film it is not so simple (I see this from my first measurement using DRS - diffusive reflectance spectra). I try to read how to eliminate effect of interference from glass substrate in reflectance or transmitance measurements. I see from other discussion, It is one interesting method - envelope method, but probably in my case not useful, because my film is absorbing (mentioned method is aplicable only for weak absorbing film). Is it any other method similar to envelope method but useful for absorbing films?
I think that you have collegues in your Institute, who are specialist in spectral characterization of organic monolayers ;)
UV-Vis-NIR spectroscopy, PL and ellipsometry are useful. You can study the UV ViS NIR transmission spectra with respect to air medium there u can subtract substrate effect. for emission PL is useful . I think below paper is may useful for you.
Determination of the thickness and optical constants of amorphous silicon
R Swanepoel
Journal of Physics E: Scientific Instruments, Volume 16, Number 12
I think that you have collegues in your Institute, who are specialist in spectral characterization of organic monolayers ;)
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