I am depositing indium oxide thin film (30 nm) and nano wire (200 nm) on p-type Si substrate using E-beam evaporator. I took the XRD Measurement so i want to know how to calculate d-spacing and lattice constant and what information we will get from d-spacing and lattice constant about the structure. Even i want to know through XRD peak how we can analyse whether it is bcc- cubic or simple cubic (Manually, without comparing withJCPDS File, is there any manual way). I am attaching XRD Measurement file. The XRD peaks are 211/ at 21 (degree) , 222/ 33(deg) ,622 / 62(deg) , 032/ 69 (deg).
Please suggest.