I am trying to obtain the instrumental broadening from my XRD equipment, and before buying a LaB6 NIST standard I wanted to try the KCl method from Scardi et al (1994). This method consists on sieving the KCl and treating it thermically to obtain a useful standard.
Regarding this I have two doubts:
- How can I check if the KCl sample I have analysed is suitable for the instrumental broadening removal?
- Do you think this procedure (done in the paper for a Bragg-Brentano geometry) is suitable also for GIXRD?
The software I am using is the HighScore Plus.
Reference:
Scardi, P.; Lutterotti, L.; Maistrelli, P. Experimental Determination of the Instrumental Broadening in the Bragg–Brentano Geometry. Powder Diffr 1994, 9(3), 180–186. https://doi.org/10.1017/S0885715600019187.
Article Experimental Determination of the Instrumental Broadening in...
Hi,
you can also use Silicon for removing the instrumental broadening. Section 3.2 and 3.3 of this paper could be helpful.
Article Structural analysis of Ce 0.83 Dy 0.14 Ca 0.03 O 1.90 (CDC) ...
thanks,
Khagesh
Khagesh Tanwar Thanks a lot for your answer. This paper is very interesting and helpful, but the authords do not specify the details of the silicon sample they use as standard.
Do you know something else I might be missing?
Marck Anthony Alava Galarza I'm the first author of the paper :D, thanks!
We got this Si standard sample from NIST, I don't exactly remember the batch number unfortunately, but these are standard sample without any strain or preferred orientation in the Si lattice. I think it should be very easy to find these samples by searching standard strain free Si samples for XRD reference.
Thanks,
I hope this is helpful
Khagesh Tanwar thanks! I'll check it out, sure Si NIST standard is a good choice for my research.
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