I am studying textured coating by means of x-ray diffraction (XRD). I prepared a batch of coatings by PVD changing the amount of nitrogen introduced, therefore I expect a different composition and crystallographic structure.
I am trying to get the Texture Coefficient (TC) value calculated by the following formula:
Intensity(hkl)/sum-of-all-Intensities(hkl)
A better description of the formula is attached in a picture.
My question is: how do I use this formula when peaks from the substrate appear in all my diffractograms? Do I "simply" remove the peaks from the substrate?
Identify peaks of interest, calculated peak intensity ratios for coating paeks, reference intensities etc
Yeap you need to delete peaks from your substrate, because peak from your substrate is too much compared with peak from your film
Md Imran Islam but the intensity ratios of the whole difractogram take into account peaks from the substrate and peaks of no interest. Do you propose that I ignore the rest of the peaks for the profile fitting and intensity calculation?
Thanks!
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