How can I process the SAED TEM images to determine the crystalline planes of my nanocrystals?
I can see in the images the concentric cones of diffraction and marked atomic positions. But I do not know how to process the image to obtain the interplanar distance using the scale bar (5 1 / nm). How to use the Fourrier transform in this case?
Thank you for your attention.
Best regards,
Felipe Leon
There are several identical topics on RG, please check them first:
https://www.researchgate.net/post/How_to_interpret_the_SAED_ring_pattern_and_how_can_i_correlate_with_the_XRD_data_Kindly_help_anyone
https://www.researchgate.net/post/How_to_analyze_The_SAED_pattern_generated_by_TEM_and_how_to_calculate_the_d_spacing_from_it_and_what_are_the_parameters_I_need_know
But here are few additional texts that may be helpful:
- http://www.xray.cz/xray/csca/kol2009/abst/klementova.htm
- http://www.jems-saas.ch/Home/PDF/SAEDIndexing.pdf
- https://www.uio.no/studier/emner/matnat/fys/MENA3100/v08/undervisningsmateriale/Diffraction/ED%20in%20TEM_part2.ppt
we can verify the distances on SAED with XRD spectra also for finding inter planar distance.
easy link
https://instanano.com/characterization/theoretical/saed-d-value-calculation-2/
Dear Felipe
you can get d spacing value from the analysed data and can get back to the XRD. Also, the SAED pattern can be compared with the reported results, if any.
Using Image J software you can first measure the radius of diffraction spots (circles). Then the reciprocal of the radius should be matched with the standard data (JCPDS). Each plane corresponding the reciprocal of the radius should be marked. Like this way you can determine the diffraction plane.
