Dear Dr. Mohammed Sultan ,

I agree with what Dr. J. C. Tarafdar and Dr. Souvik Bhattacharjee said.

Allow me only to suggest taking a look at the following, interesting paper:

-A methodology for characterising nanoparticle size and shape using nanopores

R. Maugi, P. Hauer, J. Bowen, E. Ashman, E. Hunsicker and M. Platt

Nanoscale, 12, 262-270 (2020)

Available at: https://pubs.rsc.org/en/content/articlehtml/2020/nr/c9nr09100a

Best regards, Pierluigi Traverso

@ Mohammed, you may use particle size analyzer, SEM, TEM, AFM. These instruments are generally use to measure size and shape of the nanoparticles.

I think that if you are talking about 1-100 nm the AFM should be the more suitable. If the size is 50-1000 nm SEM is certainly more cost-effective.

If you are in the range of s > 500 nm then the traditional and evoluted particle size analyzers can be used. Malvern in this sense provide good instruments to do it rapidly and with high statistics.

Crystallite-size measurement techniques:

Scherrer or Williamson-Hall analysis of XRD pattern. For a more sophisticated analysis, Rietveld's method.

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Particle-size measurement techniques:

Electron microscopy (FESEM, TEM, HRTEM etc),

DLS (if the nanoparticles are dispersible or soluble in a suitable solvent),

AFM (suitable for thin film samples - contact mode for highly smooth surface, non-contact mode for moderate roughness),

PFM (only for certain magnetic/relaxor/piezoelectric/ferroelectric/multiferroic samples).

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Shape and morphology assignment:

Mainly electron microscopy.

If you want to know, whether the surface is porous or not, BET analysis could be done.

Dear Dr. Mohammed Sultan ,

I agree with what Dr. J. C. Tarafdar and Dr. Souvik Bhattacharjee said.

Allow me only to suggest taking a look at the following, interesting paper:

-A methodology for characterising nanoparticle size and shape using nanopores

R. Maugi, P. Hauer, J. Bowen, E. Ashman, E. Hunsicker and M. Platt

Nanoscale, 12, 262-270 (2020)

Available at: https://pubs.rsc.org/en/content/articlehtml/2020/nr/c9nr09100a

Best regards, Pierluigi Traverso

For nanomaterials

Shape : you can use FESEM/ TEM to test the morphology

Size: Crystallite size ; usually XRD is used to measure

Particle size; TEM is very good technique to measure

Dear Mohammed Sultan ,

You can do it by combining SEM and AFM. On the one hand, SEM can give you the lateral dimensions of your particle, but you don’t have quantitative information in the vertical direction. On the other hand, AFM images are the result of the convolution of the real morphology with the shape of the AFM tip, so the lateral dimensions are always overestimated, but you get the real quantitative value of the height of the nanoparticles deposited onto a substrate.

SEM, XRD and TEM

For Size: Particle size analyzer, SEM and XRD

For Shape: SEM and TEM

For particle size measurements, if you have SEM images, you can use ImageJ software to get the particle size distribution.

From XRD analysis, you can use Williamson hall or Scherrer equation to determine cristallite size.

Finally, you have also BET analysis to measure the porous volume..

The previously mentioned methods are probably the easiest and most economical, which is why they are also the most popular. But analytical ultracentrifugation methods are probably the best for characterizing the size and shape of molecules and nanoparticles. AUC is complex but this may provide a good introduction: http://www.nanoparticles.org/pdf/37-Coelfen.pdf

X- ray we can test shapes and sizes of particle

For knowing the Particle size you can use XRD and SEM.XRD usually use to measure the Crystallite size.For shape you can use SEM and TEM.These both(SEM and TEM) technique can be use according to Particle size Range.

Dear colleague,

I agree with the colleagues and orevious recommendations. I would also consider DLS, especially if you deal with non-covalent interactions or aqueous solutions...

Crystallite size is to be obtained by using xrd particle size or grain sizeand shape is to be done by SEM añd TEM

By using SEM , TEM, XRD , and if it is aqueous solution then DLS is the better option. For the NPs morphology AFM is a good choice.

Depends on the type of particle and environment in which you want to measure it. If you can dry the sample onto a substrate, the EM methods allow you to "see" size and shape. If you want to measure the particles in solution, you should use dynamic light scattering. However, it will only tell you size (usually assuming spherical shape) and not shape independently.

SEM may be used to look into the morphology and size of the NP. Also TEM may be used to study the size of NP as well. The crystallite size can be found (calculated) by Scherrer equation on XRD measurements.

Niloofar is answer is too proper choice

You can always go for microscopy techniques like SEM, TEM. These are very commonly used techniques. Also you can go for Dynamic Light Scattering (DLS) technique for nanoparticle size determination.

If your sample is a liquid or dispersible material, you can use a particle size measuring device or SEM analysis could help.

I think DRX gives you an idea of your nanoparticles (Crystallites), but for grain size I recommend using ImageJ software in SEM or TEM images, it gives you better size and distribution of nanoparticles (Number of Bins, Size of particles, Number of particles). Then, we can make a comparison.

here is a publication that helps you work better with this software:

(Calculation of particle size distribution of polyaniline salts using ImageJ, Salma Bilal et al.)

Maybe my knowledge depends on the synthetic procedure and thermal behavior. for example, some room temperature rection depends on addition reducing agent and speed of the stirring. Some autoclave reaction method depends on various temperature.

Measurement of the size of nanoparticles is better to adopt different techniques like SEM, TEM, DLS, as already mentioned for good size distribution and comparability.

TEM, FE-SEM ,DLS

by AFM, XRay and SEM

mybest regard

by AFM, XRay and SEM

mybest regard

For size: Particle size analyser and for topography scanning electron microscope and atomic force microscope