Hi Mahreen, I will break it down even further for you.

Open ImageJ, Select File → Open → whatever image file you want to analyze

Draw line over the scale bar and select Analyze → Set Scale

In "Set Scale" window enter the number value of the scale bar into the 'Known Distance' box and Change the 'Unit of Measurement' box to the "unit" in the scale bar, then check 'Global'.

Confirm that the measurement scale is correct by drawing a straight line over the scale bar edge to edge and press "M" (or Analyze/Measure), it should give you the same value as the scale bar.

Now do the same for the layer you want to measure thickness of -- draw a line edge to edge and hit "M' or Analyze/Measure.

Alternatively you can go to ImageJ site and install "line analyzer" plug in -- will do the last step somewhat automated in this case.

But in my opinion all this is worth if you have to analyze 10s of images and where the thickness parameters are related / dependent (for example where you are comparing a series of sample for their thicknesses possibly varied by processing conditions etc); where I suggest you do a batch processing of all images together taken at same image magnification and with same scale bar. But if you have to do only one or two images, you can as well follow what Kai suggested earlier, pull up the image in any of the image display program win / mac and measure it with a ruler (first the scale bar and then the layer).

Hope this helps,

Palash

usually a scale is included in the micrograph. Measure length (in pixels or whatever) of the film and of the scale and you'll readily obtyin the desired result.

ImageJ is a freeware image processing software in which you will be able to do this fairly easily. A location for download was mentioned in a recent thread here on RG.

(Edit: But you might be quicker using your computer screen and a ruler)

One comment in addition: Take care that the surface that you are measuring is perpendicular to the beam this means that the film surface is oriented parallel to the beam. Otherwise, i.e. if your film is tilted against the beam; you will only get a projection of the film cross section and the actual thickness of your film is smaller.

While measuring the thickness of the film....The film what you are looking for should be perpendicular .... If it is not so ... you will not get the actual thickness of the film ..... Better take a line scan from film to substrate region. As your film and substrate will be different elemental composition, It will decide the film thickness as it will give the sharp peak over the film.

In SEM micrograph micron bar will be there which will give you the thickness ... for that you can use Image J or by scale (hand) also you can measure. Only thing is that first measure the micron bar by scale and then the film thickness.

In terms of number..... suppose your micron bar is 100um. which comes in the scale around 10mm. now if your film thickness will give you 3mm. Therefore the film thickness will be 30um. To reduce the error zoom out the micrograph.

Another possibility is to use AFM. Make a scratch (20-30 microns wide) on the film surface. You have to do it gently to remove only the film but you cannot scratch the substrate surface. Then you can determine the film thickness from the AFM profile.

Thanks to all of you.

@ Dirk Luetzenkirchen-Hecht, I have taken image using perpendicular beam of electron but I did'nt know that it is important,thank alot.

@ Arun khalkar ,I used this link but could not download,tried 3 times but in vain.

I have imageJ software but i dont know the right way of measuring thickness using it.Kindly guide me.

Measure the lenght of your scale bar in pixels (by drawing line on it and clicking "M"). Set this value as your scale in "Analyze" --> "Set scale". And than draw a line in place where you want to measure your film thickness and press "M".

Uncle G. and YT have a lot of tutorials, try them.

Hi Mahreen, I will break it down even further for you.

Open ImageJ, Select File → Open → whatever image file you want to analyze

Draw line over the scale bar and select Analyze → Set Scale

In "Set Scale" window enter the number value of the scale bar into the 'Known Distance' box and Change the 'Unit of Measurement' box to the "unit" in the scale bar, then check 'Global'.

Confirm that the measurement scale is correct by drawing a straight line over the scale bar edge to edge and press "M" (or Analyze/Measure), it should give you the same value as the scale bar.

Now do the same for the layer you want to measure thickness of -- draw a line edge to edge and hit "M' or Analyze/Measure.

Alternatively you can go to ImageJ site and install "line analyzer" plug in -- will do the last step somewhat automated in this case.

But in my opinion all this is worth if you have to analyze 10s of images and where the thickness parameters are related / dependent (for example where you are comparing a series of sample for their thicknesses possibly varied by processing conditions etc); where I suggest you do a batch processing of all images together taken at same image magnification and with same scale bar. But if you have to do only one or two images, you can as well follow what Kai suggested earlier, pull up the image in any of the image display program win / mac and measure it with a ruler (first the scale bar and then the layer).

Hope this helps,

Palash

Thanks a lot all of you.

It depends upon the thickness of your film and the accuracy you are expecting. If your film is submicron thick, the best way to measure the thickness is to prepare a TEM specimen with FIB. SEM based imaging is quicker, but it has a limited resolution.

You can use ImageJ software to obtain the thickness.