Hello!
In our research we need to manufacture single domain microwires. So, I decide to create some microwires with different length-to-width ratios using thermal evaporation.
What is the best method of examine magnetic domain structure of microwires? Maybe, it is Kerr microscope or MFM?
Thank you!
Hi Dan,
If your microwires are not expected to have many layers, or if the domain structure is not expected to change much from surface to inner layers, then I would think MFM can do the trick for you.
The Kerr microscope should be able to better measure the depth dependence of the magnetic structure, but the MFM will have a better resolution overall
Hello, Brian Francisco, yes there is only one layer. Thank you for your answer!
Dear Dan,
MFM is not a good option. MFM is great to analyze the domain structure of NANOwires. However, MICROwire are made of a metallic core and a glass coating with micrometer thickness. The typical tip to sample distance in MFM is between 30 to 100 nm. So, having a separation between the magnetic metal and the tip of the microscope of the order of micrometers makes the signal too low to be measured.
You should use Kerr microscopy instead. Good luck with your research.
Hello, Jose-Miguel Garcia-Martin!
Ok, seems like that, thank you so much for your answer!
Good luck!
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