You can first identify its reference files and then match your XRD with that file and that file contain the plane values and then corresponding peaks can be matched with that plane value file.
As Akshat Singla mentioned, the first step is to identify the crystalline phases present in the powder pattern. There are several programs that can help with this. I would recommend either the PDF-5+ database (https://www.icdd.com/pdf-5/) or the Qualx2 software (https://www.ba.ic.cnr.it/softwareic/qualx/). The Qualx2 software uses the COD database and is free for academic institutions.
Also, search the CIF files relating to the expected products and starting reagents. Calculate the powder patterns from these, and compare with the experimental pattern.
If they do not match with the powder pattern of any material, this suggests that you have discovered a new compound. You could then index the pattern and obtain the hkl reflection information for each maximum.