Physics, Material Science, Chemistry etc. How can I fit spectroscopic ellipsometric data for pedot:pss thin films on PDMS micron thick film to get the thickness of PEDOT:PSS?
Maybe and not too sure that you can fit your data by choosing 2 organic layers (PDMS and PEDOT:PSS) instead of one layer because PDMS is an organosilicon compounds.
For ellipsometric analysis, the interfaces need to be flat and there should not be large light scattering from any layers, so that the reflection processes are coherent. If you have trouble to fit the data, you want to check these preconditions. For example, is your PDMS film transparent? If it is opaque, ellipsometry is not suitable option. Also there could be reflection from the back side of PDMS that can mess up the ellipsometric data. In that case, putting some opaque tape on the back side of PDMS could help (see attached publication).
If you are just interested in the film thickness, it is easier to use only the transparent region of the spectra for the fitting (visible for PEDOT:PSS). Or other techniques such as XRR or a surface profiler might be more practical solutions. Obtaining the accurate optical constants could be tough, but there are examples for PEDOT:PSS like attached publication, so I guess it is possible with a proper model. Anyway, use of more common substrates such as silicon is advisable for ellipsometry.
Good luck.
Article Suppression of backside reflections from transparent substrates
Article Optical Properties of Organometal Halide Perovskite Thin Fil...
You can use the transparent region of the spectra for the fitting (visible for PEDOT:PSS). Or other techniques such as XRR or a surface profiler might be more practical solutions.
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