What is the thickness of Si3N4 film, if its very thin than SIMS would be a good choice. But EDX measurements will give some idea about the stoichiometric of the film.
You do not mention meither the thickness of your film nor other possible elements present in it. IF your film is thin enough you could try EELS (electron energy loss spectroscopy) in the electron microscope. It should be able to distinguish both, Si and N.
If it is a TEM thinfilm, you can aquire an HR image.. In Digital micrograph in "process" do a FFT. In the FFT apply a circular mask on the amorphous ring if prresent. Do an IFFT, and bingo your amorphours areas will light up
Does the Energy-dispersive X-ray spectroscopy (EDX or EDS) provide the chemical composition of the material as metal or metal oxide? i.e the results obtained from the EDX are in percent for metal or for metal oxide?
I found in different published papers that the data obtained from EDX are in % of metals and other papers as % metal oxide. When we use it as metals and when as metal oxide?
Is the following sentence right or false: "EDX determines the chemical composition of materials as metals and exposes them as oxides but it doesn't mean that they are oxides". Many thanks for your reply.