I have seen some methods in web but it seems to be difficult. I am a beginner to this kind of work. Any suggestions from your side would be very helpful. Thanks in advance.
Well, in Segal case, what is the 002 ? And what region would be the amorphous one? I thought 22° is the region for crystallinity and 18° for amorphous. Please correct me if I am wrong.
Crystallinity index is the ratio of the crystalline peaks to the crystalline+amorphous peaks. Amorphous peaks are the noise in XRD data, while, from crystalline+amorphous, we mean the whole XRD profile. In the following 17 min video, I have explained in detail the crystallinity index and how to calculate it from XRD data. In the first 2.5 min, I have first explained 'what is meant by the crystallinity index'. In the rest of the video, I have taught 'how to calculate the crystallinity index from XRD data in origin for crystalline as well as amorphous materials. If you need anything further to ask, let me know. I'll appreciate your feedback on the video tutorial. I have attached the discussed files (Origin file and Excel template) here, as well as, they can be accessed from the description in the video. Thanks
How to calculate crystallinity index from XRD data using origin
You can refer to the literature doi: 10.1186/1754-6834-3-10. It's very simple to compute CI with a simple equation that is the height ratio between the intensity of the crystalline peak (I002 - IAM) and total intensity (I002) after subtraction of the background signal measured without cellulose.
But i have some question. The base peak of XRD is tilted high at the small Angle. Therefore, it is difficult to get accurate peak intensity of (Iam) and (I200). How do you deal with it? If you know, please tell me.